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Thin Film Metrology
Custom Metrology and Software for Analysis and Quality Control
of Your Manufacturing Process from k-Space

k-Space is a leading manufacturer of in situ, in-line, and ex situ thin film metrology tools designed to improve processes and increase profitability. Their thin film metrology tools are used to monitor nearly all thin-film deposition processes, including MBE, MOCVD, PLD, PVD, sputtering, and evaporation, as well as production.

kSA BandiT

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kSA ICE

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kSA 400

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kSA ACE

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kSA MOS

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kSA MOS UltraScan/ThermalScan

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kSA RHEED Simulation Software

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kSA SpectR

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