The FDG range of hot filament ion sources, are the newest and most advanced ion sputter sources available. Ideal for preparation of metals and semiconductors for a wide range of Surface Analysis techniques, including ARPES and SPM.

The focussing optics of the FDG150 are designed for XPS Depth Profiling, ISS/LEIS experiments or to use as a <15eV ion neutralization source, for Dual-Beam charge neutralisation in XPS. The FDG 150 is integrated into ScientaOmicron ARPES systems, but is available as a source only to upgrade existing ESCA systems.