All New FDG ion source brochure

The FDG range of hot filament ion sources, are the newest and most advanced ion sputter sources available. Ideal for preparation of metals and semiconductors for a wide range of Surface Analysis techniques, including ARPES and SPM.

The focussing optics of the FDG150 are designed for XPS Depth Profiling, ISS/LEIS experiments or to use as a <15eV ion neutralization source, for Dual-Beam charge neutralisation in XPS. The FDG 150 is integrated into ScientaOmicron ARPES systems, but is available as a source only to upgrade existing ESCA systems.