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Surface Science

Atomic Hydrogen Source

Ideal for the cleaning, etching and passivating semiconductor substrates

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HIS VUV Sources

The VUV source of choice for band structure analysis in XPS/UPS and ARPES systems, as well as for PEEM and Momentum Microscopy.

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EFM Evaporator Product Range

Class leading UHV mini e-beam evaporators for sub-monolayer to multilayer growth

 

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Ion Sources

Ion sources for Sample Prep, Depth Profiling and XPS “dual-beam” charge neutralisation.

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Spin Detectors

Used in analysis of 2D materials, spintronics and nanomagnetic devices and may be integrated into any ARPES analyser.

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PEEM / NanoESCA

The PEEM plus its modular upgrades can be operated standalone or as the input lens of a Momentum Microscope.

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