Skip to content
Dylan James Scientific logo
  • HOME
  • Surface Science
  • Electron & Laser-In-Vacuum Welding
  • UHV Spares & Consumables
  • Consultancy and Contracting
  • News
  • Meet Us
  • Downloads
  • Contact
Privacy PolicyCookie Policy
info@dylanjamesscientific.com

Surface Science

Atomic Hydrogen Source

Ideal for the cleaning, etching and passivating semiconductor substrates

Read more

HIS VUV Sources

The VUV source of choice for band structure analysis in XPS/UPS and ARPES systems, as well as for PEEM and Momentum Microscopy.

Read more

EFM Evaporators

Class leading UHV mini e-beam evaporators for sub-monolayer to multilayer growth

Read more

Ion Sources

Ion sources for Sample Prep, Depth Profiling and XPS “dual-beam” charge neutralisation.

Read more

Spin Detectors

Used in analysis of 2D materials, spintronics and nanomagnetic devices and may be integrated into any ARPES analyser.

Read more

PEEM / NanoESCA

The PEEM plus its modular upgrades can be operated standalone or as the input lens of a Momentum Microscope.

Read more
Conferences & Events
Downloads
Latest News
© Dylan James Scientific Ltd. All rights reserved.
  • Privacy Policy
  • Cookie Policy
  • Terms & Conditions
We use cookies to ensure that we give you the best experience on our website. If you continue to use this site we will assume that you are happy with it.OkPrivacy policy